TY - JOUR
T1 - AC Magnetron Sputtering
T2 - An Industrial Approach for High-Voltage and High-Performance Thin-Film Cathodes for Li-Ion Batteries
AU - Rikarte, Jokin
AU - Madinabeitia, Iñaki
AU - Baraldi, Giorgio
AU - Fernández-Carretero, Francisco José
AU - Bellido-González, Víctor
AU - García-Luis, Alberto
AU - Muñoz-Márquez, Miguel Ángel
N1 - Publisher Copyright:
© 2021 Wiley-VCH GmbH
PY - 2021/5/21
Y1 - 2021/5/21
N2 - Industrial-oriented mid-frequency alternating current (MF-AC) magnetron sputtering technique is used to fabricate LiNi0.5Mn1.5O4 high-voltage thin-film cathodes. Films are deposited on bare stainless-steel substrate at room temperature and then annealed to induce crystallization in disordered spinel phase. In situ X-ray diffraction is used to follow film structural evolution from room temperature to 900 °C. Scanning electron microscopy, X-ray photoelectron spectroscopy, and Raman spectroscopy are used to study the evolution with temperature of film morphology, surface chemical composition, and crystal structure arrangement, respectively. Film structure evolves almost continuously in the studied temperature range. A pattern corresponding to spinel phase is observed after annealing at 600 °C, while poor crystallization is obtained for lower temperatures, and additional unwanted phase changes are observed for higher temperatures. Cyclic voltammetry, rate capability, and cycling performance of fabricated films are tested. Only the film annealed at 600 °C shows redox peaks corresponding to Ni oxidation from 2+ to 3+ and 3+ to 4+ oxidation states, confirming that this film crystallizes in disordered spinel phase. The thin-film cathode shows good rate performance and outstanding cyclability, despite the impurities formed upon electrolyte decomposition at high voltage.
AB - Industrial-oriented mid-frequency alternating current (MF-AC) magnetron sputtering technique is used to fabricate LiNi0.5Mn1.5O4 high-voltage thin-film cathodes. Films are deposited on bare stainless-steel substrate at room temperature and then annealed to induce crystallization in disordered spinel phase. In situ X-ray diffraction is used to follow film structural evolution from room temperature to 900 °C. Scanning electron microscopy, X-ray photoelectron spectroscopy, and Raman spectroscopy are used to study the evolution with temperature of film morphology, surface chemical composition, and crystal structure arrangement, respectively. Film structure evolves almost continuously in the studied temperature range. A pattern corresponding to spinel phase is observed after annealing at 600 °C, while poor crystallization is obtained for lower temperatures, and additional unwanted phase changes are observed for higher temperatures. Cyclic voltammetry, rate capability, and cycling performance of fabricated films are tested. Only the film annealed at 600 °C shows redox peaks corresponding to Ni oxidation from 2+ to 3+ and 3+ to 4+ oxidation states, confirming that this film crystallizes in disordered spinel phase. The thin-film cathode shows good rate performance and outstanding cyclability, despite the impurities formed upon electrolyte decomposition at high voltage.
KW - AC magnetron sputtering
KW - Li-ion batteries
KW - LiNi Mn O
KW - Raman
KW - X-ray photoelectron spectroscopy
KW - thin-film cathodes
UR - http://www.scopus.com/inward/record.url?scp=85103036088&partnerID=8YFLogxK
U2 - 10.1002/admi.202002125
DO - 10.1002/admi.202002125
M3 - Article
AN - SCOPUS:85103036088
SN - 2196-7350
VL - 8
JO - Advanced Materials Interfaces
JF - Advanced Materials Interfaces
IS - 10
M1 - 2002125
ER -