TY - JOUR
T1 - Adaptive Dendritic Cell-Deep Learning Approach for Industrial Prognosis under Changing Conditions
AU - Diez-Olivan, Alberto
AU - Ortego, Patxi
AU - Ser, Javier Del
AU - Landa-Torres, Itziar
AU - Galar, Diego
AU - Camacho, David
AU - Sierra, Basilio
N1 - Publisher Copyright:
© 2005-2012 IEEE.
PY - 2021/11
Y1 - 2021/11
N2 - Industrial prognosis refers to the prediction of failures of an industrial asset based on data collected by Internet of Things sensors. Prognostic models can experience the undesired effects of concept drift, namely, the presence of nonstationary phenomena that affects the data collected over time. Consequently, fault patterns learned from data become obsolete. To overcome this issue, contextual and operational changes must be detected and managed, triggering rapid model adaptation mechanisms. This article presents an adaptive learning approach based on a dendritic cell algorithm for drift detection and a deep neural network model that dynamically adapts to new operational conditions. A kernel density estimator with drift-based bandwidth is used to generate synthetic data for a faster adaptation, focusing on fine-tuning the lowest neural layers. Experimental results over a real-world industrial problem shed light on the outperforming behavior of the proposed approach when compared to other drift detectors and classification models.
AB - Industrial prognosis refers to the prediction of failures of an industrial asset based on data collected by Internet of Things sensors. Prognostic models can experience the undesired effects of concept drift, namely, the presence of nonstationary phenomena that affects the data collected over time. Consequently, fault patterns learned from data become obsolete. To overcome this issue, contextual and operational changes must be detected and managed, triggering rapid model adaptation mechanisms. This article presents an adaptive learning approach based on a dendritic cell algorithm for drift detection and a deep neural network model that dynamically adapts to new operational conditions. A kernel density estimator with drift-based bandwidth is used to generate synthetic data for a faster adaptation, focusing on fine-tuning the lowest neural layers. Experimental results over a real-world industrial problem shed light on the outperforming behavior of the proposed approach when compared to other drift detectors and classification models.
KW - Adaptive learning
KW - Deep neural network (DNN)
KW - Dendritic cell algorithm (DCA)
KW - Imbalanced data
KW - Industrial prognosis
KW - Kernel density estimation (KDE)
UR - http://www.scopus.com/inward/record.url?scp=85101477667&partnerID=8YFLogxK
U2 - 10.1109/TII.2021.3058350
DO - 10.1109/TII.2021.3058350
M3 - Article
AN - SCOPUS:85101477667
SN - 1551-3203
VL - 17
SP - 7760
EP - 7770
JO - IEEE Transactions on Industrial Informatics
JF - IEEE Transactions on Industrial Informatics
IS - 11
M1 - 9352529
ER -