Ambient intelligence based system for life-cycle management of complex manufacturing and assembly lines

Dragan Stokic, Rui Neves-Silva, Maria Marques, Philip Reimer, Jon Agirre Ibarbia

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Citations (Scopus)

Abstract

The key idea of the work presented is to explore how a combination of advanced Ambient Intelligence (AmI) and Knowledge Management (KM) technologies can be used to assure a sustainable and safe use of Manufacturing and Assembly Lines (MAL) and their infrastructure over their life-cycle. The specific intention is to reduce the whole service-life operational costs and impact of MAL, providing new ways to monitor on-line Life-Cycle Parameters (LCP) of MAL and improved services to support MAL throughout its whole life-cycle. The paper presents a new system for effective life cycle management of complex MAL, including computation of LCP based on information obtained from AmI systems within MAL, and delivery of improved services around MAL.

Original languageEnglish
Title of host publicationINDIN 2007 Conference Proceedings - 5th IEEE International Conference on Industrial Informatics
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1197-1202
Number of pages6
ISBN (Print)1424408644, 9781424408641
DOIs
Publication statusPublished - 2007
EventINDIN 2007 - 5th IEEE International Conference on Industrial Informatics - Vienna, Austria
Duration: 23 Jun 200727 Jun 2007

Publication series

NameIEEE International Conference on Industrial Informatics (INDIN)
Volume2
ISSN (Print)1935-4576

Conference

ConferenceINDIN 2007 - 5th IEEE International Conference on Industrial Informatics
Country/TerritoryAustria
CityVienna
Period23/06/0727/06/07

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