Consolidated product line variability modeling

Joachim Bayer; Sebastien Gerard; Oystein Haugen; Jason Mansell; Birger Møller-Pedersen; Jon Oldevik; Patrick Tessier; Jean Philippe Thibault; Tanya Widen

doi:10.1007/978-3-540-33253-4_6

Consolidated product line variability modeling

Joachim Bayer, Sebastien Gerard, Oystein Haugen, Jason Mansell, Birger Møller-Pedersen, Jon Oldevik, Patrick Tessier, Jean Philippe Thibault, Tanya Widen

Cibersecuryty & Distributed Ledger Technologies

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

41 Citations (Scopus)

Abstract

In this chapter we present an improved and simplified metamodel for product line variability. This model has been consolidated from diverse approaches in the earlier research projects ESAPS, CAF and other existing work, supplied with recent research in FAMILIES. The consolidated metamodel aims to be the starting point for standardization. A standard will lay the grounds for commercial and open-source tool support. We present here a prototype tool based on the metamodel. To put the work in context, we present three different approaches for capturing variability: using standard languages (exemplified by UML 2.0), using annotations to standard languages, and using domain-specific languages. We use the same Watch example to present how variability is handled in all three approaches.

Original language	English
Title of host publication	Software Product Lines
Subtitle of host publication	Research Issues in Engineering and Management
Publisher	Springer Berlin Heidelberg
Pages	195-241
Number of pages	47
ISBN (Print)	3540332529, 9783540332527
DOIs	https://doi.org/10.1007/978-3-540-33253-4_6
Publication status	Published - 2006

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10.1007/978-3-540-33253-4_6

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AU - Bayer, Joachim

AU - Gerard, Sebastien

AU - Haugen, Oystein

AU - Mansell, Jason

AU - Møller-Pedersen, Birger

AU - Oldevik, Jon

AU - Tessier, Patrick

AU - Thibault, Jean Philippe

AU - Widen, Tanya

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Consolidated product line variability modeling

Abstract

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