@inproceedings{d2c4db37ea1b4ebd8b0217a6c49295f7,
title = "Data content scrubbing approach for SRAM based FPGA designs",
abstract = "The configuration memory of SRAM-based FPGAs can be susceptible to induced faults potentially causing errors that may impact devices' functionality (depending on the criticality of the affected bit). The accumulation of those errors increase the probability of malfunction. The scrubbing is a hardening technique utilized to refresh the configuration memory of the FPGA, which defines the functionality of the device and can store user data content. While, scrubbing of the configuration memory of FPGAs is a well established strategy, the scrubbing of the data content has not been sufficiently addressed. Due to this, the present work proposes a scrubbing approach to clean errors from the data memories implemented as BRAMs or distributed memories based, and physically validated, on the ZYNQ from Xilinx.",
keywords = "FPGA, bitstream, fault, memory, scrubbing",
author = "J. Gomez-Cornejo and I. Villalta and I. Aranzabal and I. Lopez and A. Zuloaga",
note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 31st IEEE International Symposium on Industrial Electronics, ISIE 2022 ; Conference date: 01-06-2022 Through 03-06-2022",
year = "2022",
doi = "10.1109/ISIE51582.2022.9831467",
language = "English",
series = "IEEE International Symposium on Industrial Electronics",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "649--654",
booktitle = "2022 IEEE 31st International Symposium on Industrial Electronics, ISIE 2022",
address = "United States",
}