Deflectometry setup definition for automatic chrome surface inspection

Alberto Isasi-Andrieu, Estibaliz Garrote-Contreras, Pedro Iriondo-Bengoa, David Aldama-Gant, Adrian Galdran

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

A recurrent problem in the industrial sector is the quality control and surface inspection of reflecting pieces with non-planar surfaces. This is an extended and non-solved problem because it is related not only to the material itself but also to the coating. This problem appears in a wide spectrum of industrial sectors such as automation, aeronautics or orthopaedics. In recent years, a new imaging technology called deflectometry has been introduced in the field of surface inspection for industrial applications. This technology features a high resolution camera and a dedicated illumination system -based on displaying fringe patterns in a monitor- Allowing the detection of irregularities in surfaces. However, the introduction of this technology into automated quality control systems remains a challenging task, due to the wide range of defects and shapes that can appear. It becomes thus necessary to characterize different types of errors and their associated detection setups. In this paper we propose a novel methodology to define and analyse the best setup for each pattern. We also explore an efficient technique to maximize the number of different pieces inspected without modifying the setup of the acquisition system. Experimental results show that the presented methodology defines an inspection method that can be installed in an automatic quality control device for non-planar surfaces analysis of manufactured products.

Original languageEnglish
Title of host publication2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1-4
Number of pages4
ISBN (Electronic)9781509065059
DOIs
Publication statusPublished - 28 Jun 2017
Event22nd IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2017 - Limassol, Cyprus
Duration: 12 Sept 201715 Sept 2017

Publication series

NameIEEE International Conference on Emerging Technologies and Factory Automation, ETFA
ISSN (Print)1946-0740
ISSN (Electronic)1946-0759

Conference

Conference22nd IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2017
Country/TerritoryCyprus
CityLimassol
Period12/09/1715/09/17

Keywords

  • Computer vision
  • Deflectometry
  • Quality control
  • Surface inspection

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