Development of a resistivity standard for polymeric materials used in photovoltaic modules

Michael D. Kempe, David C. Miller, Dylan L. Nobles, Keiichiro Sakurai, John Tucker, Jayesh G. Bokria, Tsuyoshi Shioda, Kumar Nanjundiah, Toshio Yoshihara, Jeff Birchmier, Oihana Zubillaga, John H. Wohlgemuth

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

Photovoltaic (PV) modules, operate at high voltages and elevated temperatures, and are known to degrade because of leakage current to ground. Related degradation processes may include: electric/ionic corrosion, electrochemical deposition, electromigration, and/or charge build-up in thin layers. The use of polymeric materials with a high resistivity is known to reduce the rate of potential induced degradation processes. Because of this, PV materials suppliers are placing increased importance on the encapsulant bulk resistivity, but there is no universally accepted method for making this measurement. The development of a resistivity test standard is described in this paper. We have performed a number of exploratory and round-robin tests to establish a representative and reproducible method for determining the bulk resistivity of polymeric materials, including encapsulation, backsheet, edge seals, and adhesives. The duration of measurement has been shown to greatly affect the results, e.g., an increase as great as 100X was seen for different measurement times. The standard has been developed using measurements alternating between an on and off voltage state with a weighted averaging function and cycle times of an hour.

Original languageEnglish
Title of host publicationReliability of Photovoltaic Cells, Modules, Components, and Systems VIII
EditorsNeelkanth G. Dhere, Rebecca Jones-Albertus, John H. Wohlgemuth
PublisherSPIE
ISBN (Electronic)9781628417296
DOIs
Publication statusPublished - 2015
Event8th Reliability of Photovoltaic Cells, Modules, Components and Systems Conference - San Diego, United States
Duration: 9 Aug 201510 Aug 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9563
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference8th Reliability of Photovoltaic Cells, Modules, Components and Systems Conference
Country/TerritoryUnited States
CitySan Diego
Period9/08/1510/08/15

Keywords

  • Encapsulant
  • Photovoltaic
  • Resistivity
  • Standard

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