Evidence of covalent bond formation at the silane-metal interface during plasma polymerization of bis-1,2-(triethoxysilyl)ethane (BTSE) on aluminium

A. Batan; N. Mine; B. Douhard; F. Brusciotti; I. De Graeve; J. Vereecken; M. Wenkin; M. Piens; H. Terryn; J. J. Pireaux; F. Reniers

doi:10.1016/j.cplett.2010.05.002

Evidence of covalent bond formation at the silane-metal interface during plasma polymerization of bis-1,2-(triethoxysilyl)ethane (BTSE) on aluminium

A. Batan^*
, N. Mine
, B. Douhard
, F. Brusciotti
, I. De Graeve
, J. Vereecken
, M. Wenkin
, M. Piens
, H. Terryn
, J. J. Pireaux
, F. Reniers

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

24 Citations (Scopus)

Abstract

Silane and silane-like films were deposited from bis-1,2-(triethoxysilyl) ethane by vacuum and atmospheric plasma onto aluminium. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used for probing the aluminium/plasma polymer film interface. An AlOSi⁺ fragment was identified at nominal mass m/z = 70.9539 amu, indicating a strong chemical interaction (formation of a covalent bond) at the substrate/film interface. Until now, this strong silane-aluminium interaction has never been observed in plasma polymer BTSE films. Ageing tests in an ultrasonic water bath combined with X-ray photoelectron spectroscopy measurements allowed to indirectly confirm good adhesion, and therefore the formation of a chemical bond at the interface.

Original language	English
Pages (from-to)	107-112
Number of pages	6
Journal	Chemical Physics Letters
Volume	493
Issue number	1-3
DOIs	https://doi.org/10.1016/j.cplett.2010.05.002
Publication status	Published - 17 Jun 2010
Externally published	Yes

Keywords

BTSE
Plasma polymer films
Silane
ToF-SIMS
XPS

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10.1016/j.cplett.2010.05.002

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Batan, A., Mine, N., Douhard, B., Brusciotti, F., De Graeve, I., Vereecken, J., Wenkin, M., Piens, M., Terryn, H., Pireaux, J. J., & Reniers, F. (2010). Evidence of covalent bond formation at the silane-metal interface during plasma polymerization of bis-1,2-(triethoxysilyl)ethane (BTSE) on aluminium. Chemical Physics Letters, 493(1-3), 107-112. https://doi.org/10.1016/j.cplett.2010.05.002

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title = "Evidence of covalent bond formation at the silane-metal interface during plasma polymerization of bis-1,2-(triethoxysilyl)ethane (BTSE) on aluminium",

abstract = "Silane and silane-like films were deposited from bis-1,2-(triethoxysilyl) ethane by vacuum and atmospheric plasma onto aluminium. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used for probing the aluminium/plasma polymer film interface. An AlOSi+ fragment was identified at nominal mass m/z = 70.9539 amu, indicating a strong chemical interaction (formation of a covalent bond) at the substrate/film interface. Until now, this strong silane-aluminium interaction has never been observed in plasma polymer BTSE films. Ageing tests in an ultrasonic water bath combined with X-ray photoelectron spectroscopy measurements allowed to indirectly confirm good adhesion, and therefore the formation of a chemical bond at the interface.",

keywords = "BTSE, Plasma polymer films, Silane, ToF-SIMS, XPS",

author = "A. Batan and N. Mine and B. Douhard and F. Brusciotti and \{De Graeve\}, I. and J. Vereecken and M. Wenkin and M. Piens and H. Terryn and Pireaux, \{J. J.\} and F. Reniers",

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doi = "10.1016/j.cplett.2010.05.002",

language = "English",

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Batan, A, Mine, N, Douhard, B, Brusciotti, F, De Graeve, I, Vereecken, J, Wenkin, M, Piens, M, Terryn, H, Pireaux, JJ & Reniers, F 2010, 'Evidence of covalent bond formation at the silane-metal interface during plasma polymerization of bis-1,2-(triethoxysilyl)ethane (BTSE) on aluminium', Chemical Physics Letters, vol. 493, no. 1-3, pp. 107-112. https://doi.org/10.1016/j.cplett.2010.05.002

TY - JOUR

T1 - Evidence of covalent bond formation at the silane-metal interface during plasma polymerization of bis-1,2-(triethoxysilyl)ethane (BTSE) on aluminium

AU - Batan, A.

AU - Mine, N.

AU - Douhard, B.

AU - Brusciotti, F.

AU - De Graeve, I.

AU - Vereecken, J.

AU - Wenkin, M.

AU - Piens, M.

AU - Terryn, H.

AU - Pireaux, J. J.

AU - Reniers, F.

PY - 2010/6/17

Y1 - 2010/6/17

N2 - Silane and silane-like films were deposited from bis-1,2-(triethoxysilyl) ethane by vacuum and atmospheric plasma onto aluminium. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used for probing the aluminium/plasma polymer film interface. An AlOSi+ fragment was identified at nominal mass m/z = 70.9539 amu, indicating a strong chemical interaction (formation of a covalent bond) at the substrate/film interface. Until now, this strong silane-aluminium interaction has never been observed in plasma polymer BTSE films. Ageing tests in an ultrasonic water bath combined with X-ray photoelectron spectroscopy measurements allowed to indirectly confirm good adhesion, and therefore the formation of a chemical bond at the interface.

AB - Silane and silane-like films were deposited from bis-1,2-(triethoxysilyl) ethane by vacuum and atmospheric plasma onto aluminium. Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was used for probing the aluminium/plasma polymer film interface. An AlOSi+ fragment was identified at nominal mass m/z = 70.9539 amu, indicating a strong chemical interaction (formation of a covalent bond) at the substrate/film interface. Until now, this strong silane-aluminium interaction has never been observed in plasma polymer BTSE films. Ageing tests in an ultrasonic water bath combined with X-ray photoelectron spectroscopy measurements allowed to indirectly confirm good adhesion, and therefore the formation of a chemical bond at the interface.

KW - BTSE

KW - Plasma polymer films

KW - Silane

KW - ToF-SIMS

KW - XPS

UR - https://www.scopus.com/pages/publications/77954214763

U2 - 10.1016/j.cplett.2010.05.002

DO - 10.1016/j.cplett.2010.05.002

M3 - Article

AN - SCOPUS:77954214763

SN - 0009-2614

VL - 493

SP - 107

EP - 112

JO - Chemical Physics Letters

JF - Chemical Physics Letters

IS - 1-3

ER -

Evidence of covalent bond formation at the silane-metal interface during plasma polymerization of bis-1,2-(triethoxysilyl)ethane (BTSE) on aluminium

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Keywords

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