TY - GEN
T1 - Fast, robust and simple all optical far-field nano-positioning measurements
AU - Juan, M. L.
AU - Tischler, N.
AU - Fernandez-Corbaton, I.
AU - Zambrana-Puyalto, X.
AU - Vidal, X.
AU - Molina-Terriza, G.
PY - 2013
Y1 - 2013
N2 - We present a novel method for the nano-positioning measurements of a sample. Based on symmetry considerations, the method transforms the problem of position sensing into identification of topologically robust features obtained from the scattered field. In particular, we exploit the cylindrical symmetry of a control defect appended to the sample. Experimentally, we demonstrate a precision of 10 nm (λ/60) which is limited by the stability of our mechanical set-up, rather than the fundamental resolution of the technique. This far field method provides a deeply sub-wavelength precision and the possibility of rapidly retrieving the initial zero position. In addition, we envision that the principles of the technique could be adapted to other measurements and variety sample geometries.
AB - We present a novel method for the nano-positioning measurements of a sample. Based on symmetry considerations, the method transforms the problem of position sensing into identification of topologically robust features obtained from the scattered field. In particular, we exploit the cylindrical symmetry of a control defect appended to the sample. Experimentally, we demonstrate a precision of 10 nm (λ/60) which is limited by the stability of our mechanical set-up, rather than the fundamental resolution of the technique. This far field method provides a deeply sub-wavelength precision and the possibility of rapidly retrieving the initial zero position. In addition, we envision that the principles of the technique could be adapted to other measurements and variety sample geometries.
KW - Nano-optics
KW - Nano-positioning
KW - Scattering
UR - https://www.scopus.com/pages/publications/84881110040
M3 - Conference contribution
AN - SCOPUS:84881110040
SN - 9781482205848
T3 - Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013
SP - 412
EP - 415
BT - Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013
T2 - Nanotechnology 2013: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2013 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2013
Y2 - 12 May 2013 through 16 May 2013
ER -