Abstract
Silicon wafers coated with Indium Tin Oxide (ITO) by application of sputtering technique have been characterized after different post-annealing techniques, showing that this last factor is critical for the quality of the thin-film and for the creation and tuning of both surface plasmon resonances and lossy mode resonances. By adequate selection of the ITO thin-film thickness both resonances can be tracked in the same spectrum, which can be used in sensor and optical communications fields.
| Original language | English |
|---|---|
| Pages (from-to) | 1-7 |
| Number of pages | 7 |
| Journal | Optics and Laser Technology |
| Volume | 69 |
| DOIs | |
| Publication status | Published - Jun 2015 |
| Externally published | Yes |
Keywords
- Optical resonance
- Sensors
- Thin films