Industrial process monitoring by means of recurrent neural networks and Self Organizing Maps

  • Daniel Zurita
  • , Enric Sala
  • , Jesus A. Carino
  • , Miguel Delgado
  • , Juan A. Ortega

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Citations (Scopus)

Abstract

Industrial manufacturing plants often suffer from reliability problems during their day-to-day operations which have the potential for causing a great impact on the effectiveness and performance of the overall process and the sub-processes involved. Time-series forecasting of critical industrial signals presents itself as a way to reduce this impact by extracting knowledge regarding the internal dynamics of the process and advice any process deviations before it affects the productive process. In this paper, a novel industrial condition monitoring approach based on the combination of Self Organizing Maps for operating point codification and Recurrent Neural Networks for critical signal modeling is proposed. The combination of both methods presents a strong synergy, the information of the operating condition given by the interpretation of the maps helps the model to improve generalization, one of the drawbacks of recurrent networks, while assuring high accuracy and precision rates. Finally, the complete methodology, in terms of performance and effectiveness is validated experimentally with real data from a copper rod industrial plant.

Original languageEnglish
Title of host publication2016 IEEE 21st International Conference on Emerging Technologies and Factory Automation, ETFA 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781509013142
DOIs
Publication statusPublished - 3 Nov 2016
Externally publishedYes
Event21st IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2016 - Berlin, Germany
Duration: 6 Sept 20169 Sept 2016

Publication series

NameIEEE International Conference on Emerging Technologies and Factory Automation, ETFA
Volume2016-November
ISSN (Print)1946-0740
ISSN (Electronic)1946-0759

Conference

Conference21st IEEE International Conference on Emerging Technologies and Factory Automation, ETFA 2016
Country/TerritoryGermany
CityBerlin
Period6/09/169/09/16

Keywords

  • Artificial intelligence
  • Condition monitoring
  • Feature extraction
  • Machine learning
  • Recurrent neural networks
  • Self-Organizing maps

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