Abstract
This experimental study demonstrates that with transverse magneto-optical Kerr effect (T-MOKE) ellipsometry, it is possible to determine the magneto-optical and magnetic properties of insertion layers, even if they are superimposed onto much larger magnetic signals from the surrounding structure. Hereby, it turns out to be especially valuable that with T-MOKE ellipsometry one has full and precise quantitative access to the complex value of the magneto-optical reflection matrix component β, because small magneto-optical insertion layer signals do not necessarily increase the absolute size of β, but can lead to observable phase changes of this complex quantity instead. We demonstrate the ability of T-MOKE ellipsometry to precisely detect such small effects and hereby allow for an accurate determination of the alloy concentration dependent onset of ferromagnetism in ultrathin Co x Ru1-x insertion layers, that are embedded into a much thicker ferromagnetic structure. In addition, a detailed and quantitative signal analysis allowed us to demonstrate that the Co x Ru1-x insertion layers in our samples exhibit a magnetization reversal behavior that is independent of the adjacent Y3Fe5O12 layers, clearly indicating that both magnetic entities are either not or only very weakly coupled.
| Original language | English |
|---|---|
| Article number | 435002 |
| Journal | Journal of Physics D: Applied Physics |
| Volume | 54 |
| Issue number | 43 |
| DOIs | |
| Publication status | Published - Oct 2021 |
| Externally published | Yes |
Keywords
- insertion layer magnetism
- interlayer magnetism
- layer resolved magnetometry
- magnetic multilayers
- magneto-optical ellipsometry
- magneto-optical Kerr effect
- ultra thin magnetic films
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