Model and quality driven embedded systems engineering

Eila Ovaska, Kari Tiensyrjä, Sergio Campos, Adrian Noguero, Josetxo Vicedo, András Balogh, András Pataricza

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

1 Citation (Scopus)

Abstract

The world of embedded systems is broad and diverse, addressing a wide variety of application domains. Although technologically, the situation for embedded systems is still quite fragmented, platform-based engineering, reference designs and maturing system domains have effected great changes. However, the features of modern embedded systems are changing at such a rate that it is increasingly difficult for companies to bring new products to the market within acceptable time scales and still guarantee acceptable levels of operational quality. This report aims for its part to increase the convergence of views with regard to embedded systems technologies and engineering methods. The objective of this report is to introduce the methodology framework for model and quality driven embedded systems engineering. The framework is composed of three key artefacts, which provide the basis for building specific methodology instances. While instantiating this methodology framework, it has to be adapted to the needs and constraints of that specific application domain and development organisation. The first key artefact of the methodology framework is the process model, the Y-chart model. The second key artefact is the Unified Modelling Language (UML) adapted to embedded systems engineering with a specific profile. The third key artefact consists of a set of evaluation methods that have been selected for use in embedded system engineering. Within the conclusions, an initial integrated development environment is introduced for embedded systems engineering. The methods selected for the methodology framework have been validated in different application domains of embedded or/and software systems engineering areas.

Original languageEnglish
Title of host publicationModel and Quality Driven Embedded Systems Engineering
Pages1-208
Number of pages208
Edition705
Publication statusPublished - 2009

Publication series

NameVTT Publications
Number705
ISSN (Print)1235-0621
ISSN (Electronic)1455-0849

Keywords

  • Embedded systems engineering
  • Evaluation
  • Methodology
  • Modelling
  • Quality

Fingerprint

Dive into the research topics of 'Model and quality driven embedded systems engineering'. Together they form a unique fingerprint.

Cite this