Optimization of Operating Parameters for the Determination of Normalized Components in Thin Films Based on Trivalent Chromium and Titanium by the FP Method RFA

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Actual tasks are to study the possibility of conducting RFA of passive films by the FP method and to develop a possible method for the production of control samples of films, the solution of which will significantly increase the precision, profitability, and safety of analysis. The method of X-ray fluorescence analysis provides the simultaneous determination of a large number of elements in a wide range of concentrations, rapid measurements.

Original languageEnglish
Title of host publicationProceedings - 2022 4th International Conference on Control Systems, Mathematical Modeling, Automation and Energy Efficiency, SUMMA 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages655-660
Number of pages6
ISBN (Electronic)9781665456593
DOIs
Publication statusPublished - 2022
Externally publishedYes
Event4th International Conference on Control Systems, Mathematical Modeling, Automation and Energy Efficiency, SUMMA 2022 - Lipetsk, Russian Federation
Duration: 9 Nov 202211 Nov 2022

Publication series

NameProceedings - 2022 4th International Conference on Control Systems, Mathematical Modeling, Automation and Energy Efficiency, SUMMA 2022

Conference

Conference4th International Conference on Control Systems, Mathematical Modeling, Automation and Energy Efficiency, SUMMA 2022
Country/TerritoryRussian Federation
CityLipetsk
Period9/11/2211/11/22

Keywords

  • chromium
  • thin films
  • titanium
  • X-ray fluorescence analysis

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