TY - GEN
T1 - Partial discharge analysis of multi-defect probes
AU - Llovera, P.
AU - Muñoz, S.
AU - Quijano, A.
AU - Kortajarena, A.
AU - Muñoz, D.
PY - 2004
Y1 - 2004
N2 - Partial discharges measurement and analysis is a common tool for insulating systems diagnosis. In the last years, much work has been done on single defect probes in order to obtain characteristic patterns identifying defects, but very little research has been published on multi-defect systems. In that general context, the aim of the Spanish national research project MEFADEP was to investigate into the failure and degradation mechanisms of insulating materials through observing the behaviour of different types of defects in several probes. Some silicon probes were tested containing standard defects for validation of the single defect discrimination and classification method. Afterwards, some measurements were carried out to provide an attempt on multi-defect identification and classification. Experimental results on some multi-defect measurements were obtained. Some guidelines for an identification and classification method of multi-defect measurements are suggested.
AB - Partial discharges measurement and analysis is a common tool for insulating systems diagnosis. In the last years, much work has been done on single defect probes in order to obtain characteristic patterns identifying defects, but very little research has been published on multi-defect systems. In that general context, the aim of the Spanish national research project MEFADEP was to investigate into the failure and degradation mechanisms of insulating materials through observing the behaviour of different types of defects in several probes. Some silicon probes were tested containing standard defects for validation of the single defect discrimination and classification method. Afterwards, some measurements were carried out to provide an attempt on multi-defect identification and classification. Experimental results on some multi-defect measurements were obtained. Some guidelines for an identification and classification method of multi-defect measurements are suggested.
UR - http://www.scopus.com/inward/record.url?scp=10044287314&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:10044287314
SN - 0780383486
T3 - Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
SP - 644
EP - 647
BT - Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
T2 - Proceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
Y2 - 5 July 2004 through 9 July 2004
ER -