Partial discharge analysis of multi-defect probes

P. Llovera*, S. Muñoz, A. Quijano, A. Kortajarena, D. Muñoz

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Partial discharges measurement and analysis is a common tool for insulating systems diagnosis. In the last years, much work has been done on single defect probes in order to obtain characteristic patterns identifying defects, but very little research has been published on multi-defect systems. In that general context, the aim of the Spanish national research project MEFADEP was to investigate into the failure and degradation mechanisms of insulating materials through observing the behaviour of different types of defects in several probes. Some silicon probes were tested containing standard defects for validation of the single defect discrimination and classification method. Afterwards, some measurements were carried out to provide an attempt on multi-defect identification and classification. Experimental results on some multi-defect measurements were obtained. Some guidelines for an identification and classification method of multi-defect measurements are suggested.

Original languageEnglish
Title of host publicationProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
Pages644-647
Number of pages4
Publication statusPublished - 2004
EventProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004 - Toulouse, France
Duration: 5 Jul 20049 Jul 2004

Publication series

NameProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
Volume2

Conference

ConferenceProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
Country/TerritoryFrance
CityToulouse
Period5/07/049/07/04

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