Short crack growth model for the evaluation of the fatigue strength of WAAM Ti-6Al-4V alloy containing pore-type defects

Marcos Bergant*, Nicolás O. Larrosa, Alejandro Yawny, Mauro Madia

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

The role of defects in the fatigue strength of Wire Arc Additively Manufactured (WAAMed) Ti-6Al-4V is analysed by means of the IBESS model, a fracture mechanics short crack growth approach based on the cyclic R-curve. Pores and crack-like defects are analysed. Estimations of the role of pore shape and size agree well with published fatigue data of WAAM Ti-6Al-4V with pores. The model is also used to explain the effect of fabrication defects on the scatter of experimental data. This demonstrates that short crack growth models represent a suitable engineering tool for the fatigue assessment of defective AM materials.

Original languageEnglish
Article number109467
JournalEngineering Fracture Mechanics
Volume289
DOIs
Publication statusPublished - 1 Sept 2023

Funding

The authors M. Bergant and A. Yawny gratefully appreciate the funding by projects CO29 and CO47-T1 (Universidad de Cuyo), PIP 11220200100241CO (CONICET) and PICTs 00791 and A03706 (Agencia I + D + i) from Argentina. Dr N. Larrosa would like to acknowledge the funding provided by the UK Engineering and Physical Sciences Research Council under grant no. EP/S515759/1 and the support of the Ministerio de Ciencia y Tecnología of Spain through the Ramon y Cajal programme grant no. RYC2021-034574-I. Dr N. Larrosa would like to acknowledge the funding provided by the UK Engineering and Physical Sciences Research Council under grant no. EP/S515759/1 and the support of the Ministerio de Ciencia y Tecnología of Spain through the Ramon y Cajal programme grant no. RYC2021-034574-I.

FundersFunder number
Universidad de CuyoPIP 11220200100241CO
Engineering and Physical Sciences Research CouncilEP/S515759/1
Consejo Nacional de Investigaciones Científicas y TécnicasA03706, PICTs 00791
Ministerio de Ciencia y TecnologíaRYC2021-034574-I
Agencia Nacional de Promoción de la Investigación, el Desarrollo Tecnológico y la Innovación

    Keywords

    • Cyclic R-curve
    • IBESS model for short cracks-curve
    • Kitagawa-Takahashi (K-T) diagram
    • WAAM Ti-6Al-4V

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