| Original language | English |
|---|---|
| Pages (from-to) | 28-35 |
| Number of pages | 8 |
| Journal | IEEE Software |
| Volume | 18 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2001 |
SPI patterns: Learning from experience
- Marina Blanco*
- , Pedro Gutiérrez
- , Giuseppe Satriani
*Corresponding author for this work
Research output: Contribution to journal › Review article › peer-review
9
Citations
(Scopus)