SPI patterns: Learning from experience

Marina Blanco; Pedro Gutiérrez; Giuseppe Satriani

doi:10.1109/52.922722

SPI patterns: Learning from experience

Marina Blanco^*
, Pedro Gutiérrez
, Giuseppe Satriani

^*Corresponding author for this work

Cyber defense and industrial cybersecurity

Foundation TECNALIA Research & Innovation
Parque Tecnológico 204

Research output: Contribution to journal › Review article › peer-review

9 Citations (Scopus)

Original language	English
Pages (from-to)	28-35
Number of pages	8
Journal	IEEE Software
Volume	18
Issue number	3
DOIs	https://doi.org/10.1109/52.922722
Publication status	Published - 2001

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10.1109/52.922722

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title = "SPI patterns: Learning from experience",

author = "Marina Blanco and Pedro Guti{\'e}rrez and Giuseppe Satriani",

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journal = "IEEE Software",

issn = "0740-7459",

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T1 - SPI patterns

T2 - Learning from experience

AU - Blanco, Marina

AU - Gutiérrez, Pedro

AU - Satriani, Giuseppe

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JO - IEEE Software

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SPI patterns: Learning from experience

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