Abstract
Enhanced millimeter wave transmission through a subwavelenght slot placed into a corrugated conducting wafer, using perfect conductor model, is experimentally observed compared with the case of the single isolated slot. The corrugated wafer responds in a similar way as in the optical regime, in which a surface plasmon model is employed to describe the metal. Experimental results of the enhanced transmission and reflection of the corrugated wafer have been measured by using a quasioptical vector network analyzer. Future applications of enhanced subwavelength transmission in quasioptical devices are envisaged.
Original language | English |
---|---|
Pages (from-to) | 286-288 |
Number of pages | 3 |
Journal | IEEE Microwave and Wireless Components Letters |
Volume | 15 |
Issue number | 4 |
DOIs | |
Publication status | Published - Apr 2005 |
Keywords
- Corrugated wafer
- Extraordinary transmission
- Metamaterials
- Quasioptics
- Subwavelength