Understanding metric-related pitfalls in image analysis validation

  • Annika Reinke*
  • , Minu D. Tizabi*
  • , Michael Baumgartner
  • , Matthias Eisenmann
  • , Doreen Heckmann-Nötzel
  • , A. Emre Kavur
  • , Tim Rädsch
  • , Carole H. Sudre
  • , Laura Acion
  • , Michela Antonelli
  • , Tal Arbel
  • , Spyridon Bakas
  • , Arriel Benis
  • , Florian Buettner
  • , M. Jorge Cardoso
  • , Veronika Cheplygina
  • , Jianxu Chen
  • , Evangelia Christodoulou
  • , Beth A. Cimini
  • , Keyvan Farahani
    • Luciana Ferrer, Adrian Galdran, Bram van Ginneken, Ben Glocker, Patrick Godau, Daniel A. Hashimoto, Michael M. Hoffman, Merel Huisman, Fabian Isensee, Pierre Jannin, Charles E. Kahn, Dagmar Kainmueller, Bernhard Kainz, Alexandros Karargyris, Jens Kleesiek, Florian Kofler, Thijs Kooi, Annette Kopp-Schneider, Michal Kozubek, Anna Kreshuk, Tahsin Kurc, Bennett A. Landman, Geert Litjens, Amin Madani, Klaus Maier-Hein, Anne L. Martel, Erik Meijering, Bjoern Menze, Karel G.M. Moons, Henning Müller, Brennan Nichyporuk, Felix Nickel, Jens Petersen, Susanne M. Rafelski, Nasir Rajpoot, Mauricio Reyes, Michael A. Riegler, Nicola Rieke, Julio Saez-Rodriguez, Clara I. Sánchez, Shravya Shetty, Ronald M. Summers, Abdel A. Taha, Aleksei Tiulpin, Sotirios A. Tsaftaris, Ben Van Calster, Gaël Varoquaux, Ziv R. Yaniv, Paul F. Jäger*, Lena Maier-Hein*
*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

107 Citations (Scopus)

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