Ambient intelligence based system for life-cycle management of complex manufacturing and assembly lines

Dragan Stokic*, Rui Neves-Silva, Maria Marques, Philip Reimer, Jon Agirre Ibarbia

*Autor correspondiente de este trabajo

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

5 Citas (Scopus)

Resumen

The key idea of the work presented is to explore how a combination of advanced Ambient Intelligence (AmI) and Knowledge Management (KM) technologies can be used to assure a sustainable and safe use of Manufacturing and Assembly Lines (MAL) and their infrastructure over their life-cycle. The specific intention is to reduce the whole service-life operational costs and impact of MAL, providing new ways to monitor on-line Life-Cycle Parameters (LCP) of MAL and improved services to support MAL throughout its whole life-cycle. The paper presents a new system for effective life cycle management of complex MAL, including computation of LCP based on information obtained from AmI systems within MAL, and delivery of improved services around MAL.

Idioma originalInglés
Título de la publicación alojadaINDIN 2007 Conference Proceedings - 5th IEEE International Conference on Industrial Informatics
EditorialInstitute of Electrical and Electronics Engineers Inc.
Páginas1197-1202
Número de páginas6
ISBN (versión impresa)1424408644, 9781424408641
DOI
EstadoPublicada - 2007
EventoINDIN 2007 - 5th IEEE International Conference on Industrial Informatics - Vienna, Austria
Duración: 23 jun 200727 jun 2007

Serie de la publicación

NombreIEEE International Conference on Industrial Informatics (INDIN)
Volumen2
ISSN (versión impresa)1935-4576

Conferencia

ConferenciaINDIN 2007 - 5th IEEE International Conference on Industrial Informatics
País/TerritorioAustria
CiudadVienna
Período23/06/0727/06/07

Huella

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