Biodeterioration of electronic circuits by bacteria, fungi and algae

J. I. Alava; G. Oritz De Urbina; R. Solozabal; J. M. Valero

doi:10.1016/0261-3069(96)00023-4

Biodeterioration of electronic circuits by bacteria, fungi and algae

J. I. Alava^*, G. Oritz De Urbina, R. Solozabal, J. M. Valero

^*Autor correspondiente de este trabajo

Fundación TECNALIA Research & Innovation

Producción científica: Contribución a una revista › Artículo › revisión exhaustiva

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Resumen

A method has been developed to understand the impact of different groups of micro-organisms (algae, fungi and bacteria) on electronic circuits and components, usually exposed to the environment. Some differences are observed in the damage caused by these three groups of microorganisms and when running the tests with and without an applied electrical potential.

Idioma original	Inglés
Páginas (desde-hasta)	19-21
Número de páginas	3
Publicación	Materials and Design
Volumen	17
N.º	1
DOI	https://doi.org/10.1016/0261-3069(96)00023-4
Estado	Publicada - 1996

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title = "Biodeterioration of electronic circuits by bacteria, fungi and algae",

abstract = "A method has been developed to understand the impact of different groups of micro-organisms (algae, fungi and bacteria) on electronic circuits and components, usually exposed to the environment. Some differences are observed in the damage caused by these three groups of microorganisms and when running the tests with and without an applied electrical potential.",

keywords = "Biodeterioration, Electronic circuit, Micro-organism",

author = "Alava, \{J. I.\} and \{Oritz De Urbina\}, G. and R. Solozabal and Valero, \{J. M.\}",

year = "1996",

doi = "10.1016/0261-3069(96)00023-4",

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T1 - Biodeterioration of electronic circuits by bacteria, fungi and algae

AU - Alava, J. I.

AU - Oritz De Urbina, G.

AU - Solozabal, R.

AU - Valero, J. M.

PY - 1996

Y1 - 1996

N2 - A method has been developed to understand the impact of different groups of micro-organisms (algae, fungi and bacteria) on electronic circuits and components, usually exposed to the environment. Some differences are observed in the damage caused by these three groups of microorganisms and when running the tests with and without an applied electrical potential.

AB - A method has been developed to understand the impact of different groups of micro-organisms (algae, fungi and bacteria) on electronic circuits and components, usually exposed to the environment. Some differences are observed in the damage caused by these three groups of microorganisms and when running the tests with and without an applied electrical potential.

KW - Biodeterioration

KW - Electronic circuit

KW - Micro-organism

UR - https://www.scopus.com/pages/publications/11144337820

U2 - 10.1016/0261-3069(96)00023-4

DO - 10.1016/0261-3069(96)00023-4

M3 - Article

AN - SCOPUS:11144337820

SN - 0261-3069

VL - 17

SP - 19

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JO - Materials and Design

JF - Materials and Design

IS - 1

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Biodeterioration of electronic circuits by bacteria, fungi and algae

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