@inproceedings{b4d835f5ff074807bcd9b90554b2d167,
title = "Development of a resistivity standard for polymeric materials used in photovoltaic modules",
abstract = "Photovoltaic (PV) modules, operate at high voltages and elevated temperatures, and are known to degrade because of leakage current to ground. Related degradation processes may include: electric/ionic corrosion, electrochemical deposition, electromigration, and/or charge build-up in thin layers. The use of polymeric materials with a high resistivity is known to reduce the rate of potential induced degradation processes. Because of this, PV materials suppliers are placing increased importance on the encapsulant bulk resistivity, but there is no universally accepted method for making this measurement. The development of a resistivity test standard is described in this paper. We have performed a number of exploratory and round-robin tests to establish a representative and reproducible method for determining the bulk resistivity of polymeric materials, including encapsulation, backsheet, edge seals, and adhesives. The duration of measurement has been shown to greatly affect the results, e.g., an increase as great as 100X was seen for different measurement times. The standard has been developed using measurements alternating between an on and off voltage state with a weighted averaging function and cycle times of an hour.",
keywords = "Encapsulant, Photovoltaic, Resistivity, Standard",
author = "Kempe, {Michael D.} and Miller, {David C.} and Nobles, {Dylan L.} and Keiichiro Sakurai and John Tucker and Bokria, {Jayesh G.} and Tsuyoshi Shioda and Kumar Nanjundiah and Toshio Yoshihara and Jeff Birchmier and Oihana Zubillaga and Wohlgemuth, {John H.}",
note = "Publisher Copyright: {\textcopyright} 2015 COPYRIGHT SPIE. Downloading of the abstract is permitted for personal use only.; 8th Reliability of Photovoltaic Cells, Modules, Components and Systems Conference ; Conference date: 09-08-2015 Through 10-08-2015",
year = "2015",
doi = "10.1117/12.2189662",
language = "English",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Dhere, {Neelkanth G.} and Rebecca Jones-Albertus and Wohlgemuth, {John H.}",
booktitle = "Reliability of Photovoltaic Cells, Modules, Components, and Systems VIII",
address = "United States",
}