Development of a resistivity standard for polymeric materials used in photovoltaic modules

Michael D. Kempe, David C. Miller, Dylan L. Nobles, Keiichiro Sakurai, John Tucker, Jayesh G. Bokria, Tsuyoshi Shioda, Kumar Nanjundiah, Toshio Yoshihara, Jeff Birchmier, Oihana Zubillaga, John H. Wohlgemuth

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3 Citas (Scopus)

Resumen

Photovoltaic (PV) modules, operate at high voltages and elevated temperatures, and are known to degrade because of leakage current to ground. Related degradation processes may include: electric/ionic corrosion, electrochemical deposition, electromigration, and/or charge build-up in thin layers. The use of polymeric materials with a high resistivity is known to reduce the rate of potential induced degradation processes. Because of this, PV materials suppliers are placing increased importance on the encapsulant bulk resistivity, but there is no universally accepted method for making this measurement. The development of a resistivity test standard is described in this paper. We have performed a number of exploratory and round-robin tests to establish a representative and reproducible method for determining the bulk resistivity of polymeric materials, including encapsulation, backsheet, edge seals, and adhesives. The duration of measurement has been shown to greatly affect the results, e.g., an increase as great as 100X was seen for different measurement times. The standard has been developed using measurements alternating between an on and off voltage state with a weighted averaging function and cycle times of an hour.

Idioma originalInglés
Título de la publicación alojadaReliability of Photovoltaic Cells, Modules, Components, and Systems VIII
EditoresNeelkanth G. Dhere, Rebecca Jones-Albertus, John H. Wohlgemuth
EditorialSPIE
ISBN (versión digital)9781628417296
DOI
EstadoPublicada - 2015
Evento8th Reliability of Photovoltaic Cells, Modules, Components and Systems Conference - San Diego, Estados Unidos
Duración: 9 ago 201510 ago 2015

Serie de la publicación

NombreProceedings of SPIE - The International Society for Optical Engineering
Volumen9563
ISSN (versión impresa)0277-786X
ISSN (versión digital)1996-756X

Conferencia

Conferencia8th Reliability of Photovoltaic Cells, Modules, Components and Systems Conference
País/TerritorioEstados Unidos
CiudadSan Diego
Período9/08/1510/08/15

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