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How to Quantify the Security Level of Embedded Systems? A Taxonomy of Security Metrics

  • IKERLAN

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

10 Citas (Scopus)

Resumen

Embedded Systems (ES) development has been historically focused on functionality rather than security, and today it still applies in many sectors and applications. However, there is an increasing number of security threats over ES, and a successful attack could have economical, physical or even human consequences, since many of them are used to control critical applications. A standardized and general accepted security testing framework is needed to provide guidance, common reporting forms and the possibility to compare the results along the time. This can be achieved by introducing security metrics into the evaluation or assessment process. If carefully designed and chosen, metrics could provide a quantitative, repeatable and reproducible value that would reflect the level of security protection of the ES. This paper analyzes the features that a good security metric should exhibit, introduces a taxonomy for classifying them, and finally, it carries out a literature survey on security metrics for the security evaluation of ES. In this review, more than 500 metrics were collected and analyzed. Then, they were reduced to 169 metrics that have the potential to be applied to ES security evaluation. As expected, the 77.5% of them is related exclusively to software, and only the 0.6% of them addresses exclusively hardware security. This work aims to lay the foundations for constructing a security evaluation methodology that uses metrics so as to quantify the security level of an ES.

Idioma originalInglés
Título de la publicación alojadaProceedings - 2020 IEEE 18th International Conference on Industrial Informatics, INDIN 2020
EditorialInstitute of Electrical and Electronics Engineers Inc.
Páginas153-158
Número de páginas6
ISBN (versión digital)9781728149646
DOI
EstadoPublicada - 20 jul 2020
Publicado de forma externa
Evento18th IEEE International Conference on Industrial Informatics, INDIN 2020 - Virtual, Warwick, Reino Unido
Duración: 21 jul 202023 jul 2020

Serie de la publicación

NombreIEEE International Conference on Industrial Informatics (INDIN)
Volumen2020-July
ISSN (versión impresa)1935-4576

Conferencia

Conferencia18th IEEE International Conference on Industrial Informatics, INDIN 2020
País/TerritorioReino Unido
CiudadVirtual, Warwick
Período21/07/2023/07/20

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