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Investigation of the relative sensitivity of control of impulse X-ray television systems

  • National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

Resumen

Method of calculating the relative sensitivity for xray television systems based on X-ray screens, CCD cameras and impulse x-ray devices was proposed. To visualize the images formed by the pulsed X-ray radiation, an adjustable duration of accumulation on the CCD camera was used. The relative sensitivity of the control is determined by the intersection of dependences of the luminance and threshold contrast on the size of the defect. The comparison of calculated and experimental values of the relative sensitivity of control is made in this paper.

Idioma originalInglés
Título de la publicación alojada2013 IEEE 33rd International Scientific Conference Electronics and Nanotechnology, ELNANO 2013 - Conference Proceedings
Páginas223-226
Número de páginas4
DOI
EstadoPublicada - 2013
Publicado de forma externa
Evento2013 IEEE 33rd International Scientific Conference Electronics and Nanotechnology, ELNANO 2013 - Kyiv, Ucrania
Duración: 16 abr 201319 abr 2013

Serie de la publicación

Nombre2013 IEEE 33rd International Scientific Conference Electronics and Nanotechnology, ELNANO 2013 - Conference Proceedings

Conferencia

Conferencia2013 IEEE 33rd International Scientific Conference Electronics and Nanotechnology, ELNANO 2013
País/TerritorioUcrania
CiudadKyiv
Período16/04/1319/04/13

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