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Layer-resolved vector magnetometry using generalized magneto-optical ellipsometry

  • Carmen Martín Valderrama*
  • , Irene Prieto
  • , Mikel Quintana
  • , Ane Martínez-De-Guerenu
  • , Andreas Berger
  • *Autor correspondiente de este trabajo
  • CIC nanoGUNE
  • Basque Research and Technology Alliance (BRTA)

Producción científica: Contribución a una revistaArtículorevisión exhaustiva

1 Cita (Scopus)

Resumen

We demonstrate the ability of a single magneto-optical reflection experiment to achieve layer-resolved vector magnetometry in multilayer films. For this purpose, we designed, fabricated, and measured a set of epitaxial ferromagnetic/non-magnetic/ferromagnetic heterostructure multilayer samples that exhibit in-plane uniaxial anisotropy and a tunable ferromagnetic interlayer coupling strength through the non-magnetic interlayer. By means of generalized magneto-optical ellipsometry measurements, we obtain the magnetization angles of the two different ferromagnetic layers independently as a function of the applied field. Hereby, we observe that the magnetization switching of one layer can trigger a discontinuous shift of the magnetization angle in the second layer if ferromagnetic interlayer coupling is present. Moreover, we reproduce the obtained behavior using a model of two coupled macrospins, which corroborates even the unexpected aspects of our experimental results and thus reinforces the sensitivity and reliability of our experimental layer-resolved vector magnetometry.

Idioma originalInglés
Número de artículo022401
PublicaciónApplied Physics Letters
Volumen125
N.º2
DOI
EstadoPublicada - 8 jul 2024

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