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MedAL: Accurate and Robust Deep Active Learning for Medical Image Analysis

  • Asim Smailagic
  • , Pedro Costa
  • , Hae Young Noh
  • , Devesh Walawalkar
  • , Kartik Khandelwal
  • , Adrian Galdran
  • , Mostafa Mirshekari
  • , Jonathon Fagert
  • , Susu Xu
  • , Pei Zhang
  • , Aurelio Campilho

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

58 Citas (Scopus)

Resumen

Deep learning models have been successfully used in medical image analysis problems but they require a large amount of labeled images to obtain good performance. However, such large labeled datasets are costly to acquire. Active learning techniques can be used to minimize the number of required training labels while maximizing the model's performance. In this work, we propose a novel sampling method that queries the unlabeled examples that maximize the average distance to all training set examples in a learned feature space. We then extend our sampling method to define a better initial training set, without the need for a trained model, by using Oriented FAST and Rotated BRIEF (ORB) feature descriptors. We validate MedAL on 3 medical image datasets and show that our method is robust to different dataset properties. MedAL is also efficient, achieving 80% accuracy on the task of Diabetic Retinopathy detection using only 425 labeled images, corresponding to a 32% reduction in the number of required labeled examples compared to the standard uncertainty sampling technique, and a 40% reduction compared to random sampling.

Idioma originalInglés
Título de la publicación alojadaProceedings - 17th IEEE International Conference on Machine Learning and Applications, ICMLA 2018
EditoresM. Arif Wani, Mehmed Kantardzic, Moamar Sayed-Mouchaweh, Joao Gama, Edwin Lughofer
EditorialInstitute of Electrical and Electronics Engineers Inc.
Páginas481-488
Número de páginas8
ISBN (versión digital)9781538668047
DOI
EstadoPublicada - 2 jul 2018
Publicado de forma externa
Evento17th IEEE International Conference on Machine Learning and Applications, ICMLA 2018 - Orlando, Estados Unidos
Duración: 17 dic 201820 dic 2018

Serie de la publicación

NombreProceedings - 17th IEEE International Conference on Machine Learning and Applications, ICMLA 2018

Conferencia

Conferencia17th IEEE International Conference on Machine Learning and Applications, ICMLA 2018
País/TerritorioEstados Unidos
CiudadOrlando
Período17/12/1820/12/18

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