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Optimization of Operating Parameters for the Determination of Normalized Components in Thin Films Based on Trivalent Chromium and Titanium by the FP Method RFA

  • Lipetsk State Technical University

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

Resumen

Actual tasks are to study the possibility of conducting RFA of passive films by the FP method and to develop a possible method for the production of control samples of films, the solution of which will significantly increase the precision, profitability, and safety of analysis. The method of X-ray fluorescence analysis provides the simultaneous determination of a large number of elements in a wide range of concentrations, rapid measurements.

Idioma originalInglés
Título de la publicación alojadaProceedings - 2022 4th International Conference on Control Systems, Mathematical Modeling, Automation and Energy Efficiency, SUMMA 2022
EditorialInstitute of Electrical and Electronics Engineers Inc.
Páginas655-660
Número de páginas6
ISBN (versión digital)9781665456593
DOI
EstadoPublicada - 2022
Publicado de forma externa
Evento4th International Conference on Control Systems, Mathematical Modeling, Automation and Energy Efficiency, SUMMA 2022 - Lipetsk, Federación de Rusia
Duración: 9 nov 202211 nov 2022

Serie de la publicación

NombreProceedings - 2022 4th International Conference on Control Systems, Mathematical Modeling, Automation and Energy Efficiency, SUMMA 2022

Conferencia

Conferencia4th International Conference on Control Systems, Mathematical Modeling, Automation and Energy Efficiency, SUMMA 2022
País/TerritorioFederación de Rusia
CiudadLipetsk
Período9/11/2211/11/22

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