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Partial discharge analysis of multi-defect probes

  • P. Llovera*
  • , S. Muñoz
  • , A. Quijano
  • , A. Kortajarena
  • , D. Muñoz
  • *Autor correspondiente de este trabajo

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

Resumen

Partial discharges measurement and analysis is a common tool for insulating systems diagnosis. In the last years, much work has been done on single defect probes in order to obtain characteristic patterns identifying defects, but very little research has been published on multi-defect systems. In that general context, the aim of the Spanish national research project MEFADEP was to investigate into the failure and degradation mechanisms of insulating materials through observing the behaviour of different types of defects in several probes. Some silicon probes were tested containing standard defects for validation of the single defect discrimination and classification method. Afterwards, some measurements were carried out to provide an attempt on multi-defect identification and classification. Experimental results on some multi-defect measurements were obtained. Some guidelines for an identification and classification method of multi-defect measurements are suggested.

Idioma originalInglés
Título de la publicación alojadaProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
Páginas644-647
Número de páginas4
EstadoPublicada - 2004
EventoProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004 - Toulouse, Francia
Duración: 5 jul 20049 jul 2004

Serie de la publicación

NombreProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
Volumen2

Conferencia

ConferenciaProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
País/TerritorioFrancia
CiudadToulouse
Período5/07/049/07/04

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