Subwavelength slotted corrugated plate with enhanced quasioptical millimeter wave transmission

Enhanced millimeter wave transmission through a subwavelenght slot placed into a corrugated conducting wafer, using perfect conductor model, is experimentally observed compared with the case of the single isolated slot. The corrugated wafer responds in a similar way as in the optical regime, in which a surface plasmon model is employed to describe the metal. Experimental results of the enhanced transmission and reflection of the corrugated wafer have been measured by using a quasioptical vector network analyzer. Future applications of enhanced subwavelength transmission in quasioptical devices are envisaged.